Getchellite R050156

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Record 1553 of 4043  


Name: Getchellite
RRUFF ID: R050156
Ideal Chemistry: SbAsS3
Locality: Khaidarkan, Kyrgyzstan
Source: Jim McGlasson
Owner: RRUFF
Description: Red platy crystals
Status: The identification of this mineral has been confirmed by single-crystal X-ray diffraction.
Quick search: [ All Getchellite samples (2) ]
CHEMISTRY 
RRUFF ID: R050156.2
Sample Description: Microprobe Fragment
RAMAN SPECTRUM 
RRUFF ID:
Sample Description: Unoriented sample; sample burns under 532 nm laser.
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Direction of polarization of laser relative to fiducial mark:
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BROAD SCAN WITH SPECTRAL ARTIFACTS
RRUFF ID: R050156
Wavelength:
Sample Description: Unoriented sample; sample burns under 532 nm laser.
Instrument settings: Thermo Almega XR 532nm @ 25% of 150mW
POWDER DIFFRACTION 
RRUFF ID: R050156.9
Sample Description: Single crystal, powder profile is calculated
Cell Refinement Output: a: 11.5983(2)Å    b: 8.86870(9)Å    c: 9.8188(1)Å
alpha: 90°    beta: 115.800(1)°    gamma: 90°   Volume: 909.31(2)Å3    Crystal System: monoclinic
  File Type Information Close
Calculated diffraction file.

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Output file from the Bruker D8 Advance instrument. Includes device headers and XY data.

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REFERENCES for Getchellite

American Mineralogist Crystal Structure Database Record: [view record]

Anthony J W, Bideaux R A, Bladh K W, and Nichols M C (1990) Handbook of Mineralogy, Mineral Data Publishing, Tucson Arizona, USA, by permission of the Mineralogical Society of America. [view file]

Weissberg B G (1965) Getchellite, AsSbS3, a new mineral from Humboldt County, Nevada, American Mineralogist, 50, 1817-1826   [view file]

Guillermo T R, Wuensch B J (1973) The crystal structure of getchellite, AsSbS3, Acta Crystallographica, B29, 2536-2541

Kyono A, Kimata M (2004) Structural reinvestigation of getchellite, As0.98Sb1.02S3.00, American Mineralogist, 89, 696-700   [view file]

Bonazzi P, Bindi L (2008) A crystallographic review of arsenic sulfides: Effects of chemical variations and changes induced by exposure to light, Zeitschrift für Kristallographie, 223, 132-147