Nacrite R100066



Name: Nacrite
RRUFF ID: R100066
Ideal Chemistry: Al2Si2O5(OH)4
Locality: Geisberg, Schweighausen, Black Forest, Germany
Source: Bob Jenkins [view label]
Owner: RRUFF
Description: Stacks of parallel pseudohexagonal white plates
Status: The identification of this mineral has been confirmed only by single crystal X-ray diffraction.
Mineral Groups: [ Clay (85) ] [ Kaolinite (6) ]
RAMAN SPECTRUM 
RRUFF ID:
Sample Description: Unoriented Raman on the primary sample
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BROAD SCAN WITH SPECTRAL ARTIFACTS
RRUFF ID: R100066
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Sample Description: Unoriented Raman on the primary sample
Instrument settings: Thermo Almega XR 532nm @ 100% of 150mW
POWDER DIFFRACTION 
RRUFF ID: R100066.9
Sample Description: Single crystal, powder profile is calculated
Cell Refinement Output: a: 8.906(26)Å    b: 5.150(14)Å    c: 14.618(66)Å
alpha: 90°    beta: 100.71(8)°    gamma: 90°   Volume: 659.2(7)Å3    Crystal System: monoclinic
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Calculated diffraction file.

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Output file from the Bruker D8 Advance instrument. Includes device headers and XY data.

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REFERENCES for Nacrite

American Mineralogist Crystal Structure Database Record: [view record]

Anthony J W, Bideaux R A, Bladh K W, and Nichols M C (1990) Handbook of Mineralogy, Mineral Data Publishing, Tucson Arizona, USA, by permission of the Mineralogical Society of America. [view file]

Brongniart A (1807) Nacrite, in Traité Élémentaire de Minéralogie De L'imprimerie de Crapelet Paris 505-506   [view file]

Ross C S, Kerr P F (1930) Dickite, a kaolin mineral, American Mineralogist, 15, 34-39   [view file]

Mackenzie R C (1955) Mineralogical Society (London), American Mineralogist, 40, 773-780   [view file]

Zvyagin B B, Soboleva S V, Fedotov A F (1972) Refinement of the structure of nacrite by high-voltage electron diffraction, Soviet Physics - Crystallography, 17, 448-452   [view file]

Zheng H, Bailey S W (1994) Refinement of the nacrite structure, Clays and Clay Minerals, 42, 46-52

Zhukhlistov A P (2008) Crystal structure of nacrite from the electron diffraction data, Crystallography Reports, 53, issue 1 76-82