{\rtf1\ansi\deff0{\fonttbl{\f0\fnil\fcharset0 Courier New;}} {\*\generator Msftedit 5.41.15.1507;}\viewkind4\uc1\pard\lang1033\f0\fs20 Eskolaite\par Diffraction data computed using the structure from the paper listed below,\par along with the cell parameters refined from the powder pattern of R060892\par Newnham R E, de Haan Y M\par Zeitschrift fur Kristallographie 117 (1962) 235-237\par Refinement of the alpha Al2O3, Ti2O3, V2O3 and Cr2O3 structures\par Locality: synthetic\par \par CELL PARAMETERS: 4.9607 4.9607 13.5990 90.000 90.000 120.000\par SPACE GROUP: R-3c \par \par ATOM X Y Z OCCUPANCY ISO(B)\par Cr 0.00000 0.00000 0.34750 1.000 0.600\par O 0.30600 0.00000 0.25000 1.000 1.000\par \par X-RAY WAVELENGTH: 1.541838\par BOUNDS ON TWO THETA: 5.0 90.0\par LIMITS IMPOSED ON THE INDICES ARE: +/- 3 +/- 3 +/- 12\par MAX. ABS. INTENSITY / VOLUME**2: 38.09243960 \par The INTENSITY cut off value is 1.00\par \par 2-THETA INTENSITY D-SPACING H K L\par 24.51 69.40 3.6319 0 1 2\par 33.62 100.00 2.6660 1 0 4\par 36.22 93.42 2.4804 1 1 0\par 39.77 6.70 2.2665 0 0 6\par 41.50 27.07 2.1759 1 1 3\par 44.22 5.67 2.0483 2 0 2\par 50.24 37.40 1.8159 0 2 4\par 54.87 85.40 1.6732 1 1 6\par 58.38 1.59 1.5806 0 1 8\par 58.43 5.83 1.5794 1 2 2\par 63.49 28.95 1.4652 2 1 4\par 65.14 36.81 1.4320 3 0 0\par 72.97 14.31 1.2965 1 0 10\par 73.37 2.34 1.2904 1 1 9\par 76.87 2.70 1.2402 2 2 0\par 79.11 3.13 1.2106 0 3 6\par 79.11 3.13 1.2106 3 0 6\par 82.12 1.06 1.1736 3 1 2\par 84.28 7.35 1.1490 0 2 10\par 85.73 1.78 1.1332 0 0 12\par 86.56 2.54 1.1245 1 3 4\par ================================================================================\par XPOW Copyright 1993 Bob Downs, Ranjini Swaminathan and Kurt Bartelmehs\par For reference, see Downs et al. (1993) American Mineralogist 78, 1104-1107.\par \par }