Quartz Diffraction data computed using the structure from the paper listed below, along with the cell parameters refined from single crystal data of R100134 Antao S M, Hassan I, Wang J, Lee P L, Toby B H The Canadian Mineralogist 46 (2008) 1501-1509 State-of-the-art high-resolution powder x-ray diffraction (HRPXRD) illustrated with Rietveld structure refinement of quartz, sodalite, tremolite, and meionite Locality: not specified _database_code_amcsd 0006212 CELL PARAMETERS: 4.9220 4.9220 5.4070 90.000 90.000 120.000 SPACE GROUP: P3_221 ATOM X Y Z OCCUPANCY ISO(B) Si 0.47000 0.00000 0.66667 1.000 0.490 O 0.41460 0.26780 0.78543 1.000 0.861 X-RAY WAVELENGTH: 1.541838 BOUNDS ON TWO THETA: 5.0 90.0 LIMITS IMPOSED ON THE INDICES ARE: +/- 3 +/- 3 +/- 4 MAX. ABS. INTENSITY / VOLUME**2: 35.23383208 The INTENSITY cut off value is 1.00 2-THETA INTENSITY D-SPACING H K L 20.84 20.30 4.2626 1 0 0 26.63 69.91 3.3475 0 1 1 26.63 30.09 3.3475 1 0 1 36.51 7.13 2.4610 1 1 0 39.47 1.04 2.2830 0 1 2 39.47 6.18 2.2830 1 0 2 40.26 3.30 2.2399 1 1 1 42.41 5.37 2.1313 2 0 0 45.76 1.02 1.9828 0 2 1 45.76 2.23 1.9828 2 0 1 50.12 12.68 1.8199 1 1 2 54.85 3.19 1.6737 0 2 2 55.34 1.66 1.6600 0 1 3 59.91 5.07 1.5440 1 2 1 59.91 4.17 1.5440 2 1 1 64.03 1.76 1.4541 1 1 3 67.70 1.46 1.3840 2 1 2 67.70 4.35 1.3840 1 2 2 68.14 1.39 1.3762 0 2 3 68.14 5.47 1.3762 2 0 3 68.25 4.32 1.3742 0 3 1 73.50 1.82 1.2885 1 0 4 75.61 1.98 1.2577 3 0 2 79.85 2.45 1.2012 2 1 3 81.19 2.53 1.1848 1 1 4 ================================================================================ XPOW Copyright 1993 Bob Downs, Ranjini Swaminathan and Kurt Bartelmehs For reference, see Downs et al. (1993) American Mineralogist 78, 1104-1107.