Eulytine Diffraction data computed using the structure from the paper listed below, along with the cell parameters refined from single crystal data of R130114 Segal D J, Santoro R P, Newnham R E Zeitschrift fur Kristallographie 123 (1966) 73-76 Neutron-diffraction study of Bi4Si3O12 Locality: synthetic _database_code_amcsd 0010629 CELL PARAMETERS: 10.2990 10.2990 10.2990 90.000 90.000 90.000 SPACE GROUP: I-43d ATOM X Y Z OCCUPANCY ISO(B) Bi 0.08570 0.08570 0.08570 1.000 1.500 Si 0.37500 0.00000 0.25000 1.000 0.500 O 0.06070 0.13350 0.28750 1.000 1.000 X-RAY WAVELENGTH: 1.541838 BOUNDS ON TWO THETA: 5.0 90.0 LIMITS IMPOSED ON THE INDICES ARE: +/- 9 +/- 9 +/- 9 MAX. ABS. INTENSITY / VOLUME**2: 228.8262714 The INTENSITY cut off value is 1.00 2-THETA INTENSITY D-SPACING H K L 21.13 100.00 4.2045 2 1 1 24.45 4.35 3.6412 2 2 0 27.38 88.81 3.2568 3 1 0 32.53 91.66 2.7525 3 2 1 34.84 14.46 2.5747 4 0 0 43.03 45.96 2.1023 4 2 2 44.88 19.19 2.0198 5 1 0 44.88 24.25 2.0198 4 3 1 48.41 1.35 1.8803 5 2 1 50.10 1.63 1.8206 4 4 0 51.76 16.09 1.7663 5 3 0 54.96 21.05 1.6707 5 3 2 54.96 10.23 1.6707 6 1 1 56.51 10.37 1.6284 6 2 0 58.04 16.40 1.5892 5 4 1 61.02 13.08 1.5185 6 3 1 62.48 3.84 1.4865 4 4 4 63.92 5.36 1.4565 7 1 0 63.92 11.30 1.4565 5 4 3 66.74 5.02 1.4015 5 5 2 68.13 3.94 1.3763 6 4 2 69.51 1.66 1.3523 7 3 0 72.23 4.16 1.3080 7 3 2 74.91 7.36 1.2677 7 4 1 77.55 4.28 1.2310 6 5 3 78.86 6.04 1.2137 6 6 0 78.86 6.71 1.2137 8 2 2 80.17 5.79 1.1972 7 4 3 80.17 3.83 1.1972 8 3 1 82.77 5.08 1.1661 7 5 2 85.35 2.09 1.1373 9 1 0 87.92 4.25 1.1106 9 2 1 87.92 1.79 1.1106 6 5 5 89.21 2.54 1.0979 6 6 4 ================================================================================ XPOW Copyright 1993 Bob Downs, Ranjini Swaminathan and Kurt Bartelmehs For reference, see Downs et al. (1993) American Mineralogist 78, 1104-1107.