Pyrope Diffraction data computed using the structure from the paper listed below, along with the cell parameters refined from single crystal data of R080060 Gibbs G V, Smith J V American Mineralogist 50 (1965) 2023-2039 Refinement of the crystal structure of synthetic pyrope refinement D, note that temperature factors reported for Si were labelled incorrectly in the paper CELL PARAMETERS: 11.4550 11.4550 11.4550 90.000 90.000 90.000 SPACE GROUP: Ia-3d ATOM X Y Z OCCUPANCY ISO(B) Al 0.00000 0.00000 0.00000 1.000 0.315 Mg 0.12500 0.00000 0.25000 1.000 0.763 Si 0.37500 0.00000 0.25000 1.000 0.259 O 0.03284 0.05014 0.65330 1.000 0.490 X-RAY WAVELENGTH: 1.541838 BOUNDS ON TWO THETA: 5.0 90.0 LIMITS IMPOSED ON THE INDICES ARE: +/- 10 +/- 10 +/- 10 MAX. ABS. INTENSITY / VOLUME**2: 14.22037237 The INTENSITY cut off value is 1.00 2-THETA INTENSITY D-SPACING H K L 18.98 6.65 4.6765 2 1 1 21.95 1.74 4.0500 2 2 0 29.17 6.61 3.0615 3 2 1 31.23 55.77 2.8637 4 0 0 35.03 100.00 2.5614 4 2 0 36.80 34.71 2.4422 3 3 2 38.50 22.54 2.3382 4 2 2 40.14 25.66 2.2465 4 3 1 43.26 11.78 2.0914 5 2 1 44.75 2.67 2.0250 4 4 0 49.02 11.67 1.8582 6 1 1 49.02 6.85 1.8582 5 3 2 50.38 6.78 1.8112 6 2 0 54.32 1.94 1.6889 6 3 1 55.58 14.87 1.6534 4 4 4 58.06 41.91 1.5885 6 4 0 60.48 64.53 1.5307 6 4 2 64.00 2.65 1.4548 7 3 2 65.15 11.83 1.4319 8 0 0 66.29 2.70 1.4100 7 4 1 68.54 3.21 1.3691 6 5 3 72.94 1.60 1.2970 7 5 2 74.02 13.08 1.2807 8 4 0 76.17 17.41 1.2498 8 4 2 77.23 3.37 1.2352 7 6 1 78.30 9.71 1.2211 6 6 4 79.35 1.94 1.2075 8 5 1 79.35 2.32 1.2075 7 5 4 83.55 3.73 1.1571 8 5 3 83.55 2.86 1.1571 9 4 1 85.64 1.12 1.1342 10 1 1 86.68 1.83 1.1233 10 2 0 ================================================================================ XPOW Copyright 1993 Bob Downs, Ranjini Swaminathan and Kurt Bartelmehs For reference, see Downs et al. (1993) American Mineralogist 78, 1104-1107.