Rutile
Diffraction data computed using the structure from the paper listed below, 
along with the cell parameters refined from single crystal data of R120008
      Baur W H, Khan A A
      Acta Crystallographica B27 (1971) 2133-2139
      Rutile-type compounds. VI.
      SiO2, GeO2 and a comparison with other rutile-type structures
      _database_code_amcsd 0009404

      CELL PARAMETERS:   4.6490  4.6490  3.0030   90.000   90.000   90.000
      SPACE GROUP: P4_2/mnm  

           ATOM        X         Y         Z     OCCUPANCY  ISO(B)
            Ti     0.00000   0.00000   0.00000     1.000     0.602
            O      0.30570   0.30570   0.00000     1.000     0.644

            X-RAY WAVELENGTH:     1.541838
            BOUNDS ON TWO THETA:    5.0  90.0
            LIMITS IMPOSED ON THE INDICES ARE:  +/-  4 +/-  4 +/-  2
            MAX. ABS. INTENSITY / VOLUME**2:      45.06318122    
            The INTENSITY cut off value is   1.00

               2-THETA      INTENSITY    D-SPACING   H   K   L
                27.13        100.00        3.2873    1   1   0
                35.59         44.93        2.5225    1   0   1
                38.74          6.75        2.3245    2   0   0
                40.69         18.46        2.2172    1   1   1
                43.53          6.73        2.0791    2   1   0
                53.61         55.01        1.7094    2   1   1
                55.94         16.13        1.6437    2   2   0
                61.79          7.73        1.5015    0   0   2
                63.25          7.62        1.4701    3   1   0
                68.08         19.18        1.3771    3   0   1
                68.73          9.43        1.3658    1   1   2
                75.36          2.00        1.2613    2   0   2
                78.59          1.13        1.2173    2   1   2
                81.18          3.89        1.1848    3   2   1
                83.10          2.61        1.1623    4   0   0
                88.12          6.37        1.1086    2   2   2
                89.42          3.49        1.0958    3   3   0
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       XPOW Copyright 1993 Bob Downs, Ranjini Swaminathan and Kurt Bartelmehs
  For reference, see Downs et al. (1993) American Mineralogist 78, 1104-1107.