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Name: Silicon RRUFF ID: R050145 Ideal Chemistry: Si Locality: synthetic from Dupont Source: Gerry Gibbs Owner: RRUFF Description: Dark gray synthetic fragment Status: The identification of this mineral has been confirmed by X-ray diffraction and chemical analysis |
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| POWDER DIFFRACTION | ||||||||
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| RRUFF ID: | R050145.1 | |||||||
| Sample Description: | Powder | |||||||
| Cell Refinement Output: |
a: 5.4299(1)Å b: 5.4299(1)Å c: 5.4299(1)Å alpha: 90.° beta: 90.° gamma: 90.° Volume: 160.09(1) Crystal System: cubic |
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| REFERENCES for Silicon | |
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American Mineralogist Crystal Structure Database Record: [view record] |
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Anthony J W, Bideaux R A, Bladh K W, and Nichols M C (1990) Handbook of Mineralogy, Mineral Data Publishing, Tucson Arizona, USA, by permission of the Mineralogical Society of America. [view file] |
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Golightly J P (1969) The birefringence and dichroism of silicon carbide polytypes, The Canadian Mineralogist, 10, 105-108 [view file] |
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Manning P G (1970) Racah parameters and their relationship to lengths and covalencies of Mn2+ - and Fe3+ - oxygen bonds in silicates, The Canadian Mineralogist, 10, 677-688 [view file] |
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Schaeffer H A (1977) Oxygen and silicon diffusion-controlled processes in silicate glasses and melts, The Canadian Mineralogist, 15, 201-201 [view file] |
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Jambor J L, Puziewicz J (1991) New mineral names, American Mineralogist, 76, 665-671 [view file] |
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Jambor J L, Grew E S (1992) New mineral names, American Mineralogist, 77, 207-213 [view file] |
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Zhao X S, Ge Y R, Schroeder J, Persans P D (1994) Carrier-induced strain effect in Si and GaAs nanocrystals, Applied Physics Letters, 65, 2033-2035 |
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