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Silicon R050145

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Record 3441 of 4216  


Name: Silicon
RRUFF ID: R050145
Ideal Chemistry: Si
Locality: synthetic from Dupont
Source: Gerry Gibbs
Owner: RRUFF
Description: Dark gray synthetic fragment
Status: The identification of this mineral has been confirmed by X-ray diffraction and chemical analysis
Mineral Group: [ Diamond (18) ]
CHEMISTRY 
RRUFF ID: R050145.2
Sample Description: Microprobe fragment
Measured Chemistry: Si
RAMAN SPECTRUM 
RRUFF ID:
Sample Description: Sample is oriented, mounted onto a pin and polished
Pin ID: L00283
Orientation: Laser parallel to  -a*  (-1 0 0).     Fiducial mark perpendicular to laser is parallel to  -b   [0 -1 0].
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  orientation angle.
Direction of polarization of laser relative to fiducial mark:
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BROAD SCAN WITH SPECTRAL ARTIFACTS
RRUFF ID: R040145
Wavelength:
Sample Description: Unoriented sample
Instrument settings: Thermo Almega XR 532nm @ 100% of 150mW
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Raman Data (RAW) View Graph
RRUFF File
INFRARED SPECTRUM (Attenuated Total Reflectance) 
RRUFF ID: R050145.1
Sample Description: Powder
Instrument settings: SensIR Durascope on a Nicolet Magna 860 FTIR
Resolution:
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Infrared Data (Processed)
RRUFF File
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RRUFF ID: R050145.1
Sample Description: Powder
Instrument settings: PIKE GladiATR - Far-IR on a Nicolet Magna 860 FTIR
Resolution:
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Infrared Data (Processed)
RRUFF File
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POWDER DIFFRACTION 
RRUFF ID: R050145.1
Sample Description: Powder
Cell Refinement Output: a: 5.4299(1)Å    b: 5.4299(1)Å    c: 5.4299(1)Å
alpha: 90.°    beta: 90.°    gamma: 90.°   Volume: 160.09(1)Å3    Crystal System: cubic
  File Type Information Close
Calculated diffraction file.

  File Type Information Close
Output file from the Bruker D8 Advance instrument. Includes device headers and XY data.

  File Type Information Close
Output file from the Bruker D8 Advance instrument. Includes device headers and XY data.

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Cell Refinement Data
Cell Refinement Output Data
DIF File
X-ray Data (XY - Processed)
RRUFF File
X-ray Data (XY - RAW) View Graph
RRUFF File
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REFERENCES for Silicon

American Mineralogist Crystal Structure Database Record: [view record]

Anthony J W, Bideaux R A, Bladh K W, and Nichols M C (1990) Handbook of Mineralogy, Mineral Data Publishing, Tucson Arizona, USA, by permission of the Mineralogical Society of America. [view file]

Golightly J P (1969) The birefringence and dichroism of silicon carbide polytypes, The Canadian Mineralogist, 10, 105-108   [view file]

Schaeffer H A (1977) Oxygen and silicon diffusion-controlled processes in silicate glasses and melts, The Canadian Mineralogist, 15, 201-201   [view file]

Essene E J, Fisher D C (1986) Lightning strike fusion: extreme reduction and metal-silicate liquid immiscibility, Science, 234, 189-193

Novgorodova M I, Boronikhin V A, Generalov M E, Kramer H (1989) On native silicon in association with native gold and other metals, Doklady Akademii Nauk SSSR, 309, 1182-1185   [view file]

Jambor J L, Puziewicz J (1991) New mineral names, American Mineralogist, 76, 665-671   [view file]

Jambor J L, Grew E S (1992) New mineral names, American Mineralogist, 77, 207-213   [view file]

Zhao X S, Ge Y R, Schroeder J, Persans P D (1994) Carrier-induced strain effect in Si and GaAs nanocrystals, Applied Physics Letters, 65, 2033-2035

Degtyareva O (2010) Crystal structure of simple metals at high pressures, High Pressure Research, 30, 343-371